dc.contributor.author | Wilson, Chris | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Ablett, James | |
dc.contributor.author | Lofrano, Melina | |
dc.contributor.author | Beyer, Gerald | |
dc.contributor.author | Tokei, Zsolt | |
dc.date.accessioned | 2021-10-19T21:49:08Z | |
dc.date.available | 2021-10-19T21:49:08Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20149 | |
dc.source | IIOimport | |
dc.title | Interpretation of Cu/SOG stress induced voiding using stress measurements performed with synchrotron radiation | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Wilson, Chris | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Lofrano, Melina | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.source.peerreview | no | |
dc.source.conference | Advanced Metallization Conference - AMC | |
dc.source.conferencedate | 4/08/2011 | |
dc.source.conferencelocation | San Diego, CA USA | |
imec.availability | Published - imec | |