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Efficient sensitivity-based capacitance modeling for systematic and random geometric variations
Publication:
Efficient sensitivity-based capacitance modeling for systematic and random geometric variations
Date
2011
Proceedings Paper
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22559.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yu, Bi
;
Harpe, Pieter
;
van der Meijs, N.P.
Journal
Abstract
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1764
since deposited on 2021-10-19
Acq. date: 2025-10-28
Citations
Metrics
Views
1764
since deposited on 2021-10-19
Acq. date: 2025-10-28
Citations