The effect of passivation on the hot electron degradation of lattice-matched InAlAs/InGaAs/InP HEMTs
dc.contributor.author | Menozzi, R. | |
dc.contributor.author | Borgarino, M. | |
dc.contributor.author | Baeyens, Yves | |
dc.contributor.author | van der Zanden, Koen | |
dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | Fantini, F. | |
dc.date.accessioned | 2021-09-30T09:17:59Z | |
dc.date.available | 2021-09-30T09:17:59Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2018 | |
dc.source | IIOimport | |
dc.title | The effect of passivation on the hot electron degradation of lattice-matched InAlAs/InGaAs/InP HEMTs | |
dc.type | Proceedings paper | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 153 | |
dc.source.endpage | 156 | |
dc.source.conference | Indium Phosphide and Related Compounds Conference - IPRM | |
dc.source.conferencedate | 11/05/1997 | |
dc.source.conferencelocation | Hyannis, MA USA | |
imec.availability | Published - open access |