Digital-circuit analysis of short gate tunnel-FETs for low-voltage applications

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Authors

Zhuge, Jing; Verhulst, Anne; Vandenberghe, William; Dehaene, Wim; Huang, Ru; Wang, YangYuan; Groeseneken, Guido

ISSN

0268-1242

Issue

8

Journal

Semiconductor Science and Technology

Volume

26

Title

Digital-circuit analysis of short gate tunnel-FETs for low-voltage applications

Publication type

Journal article

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