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Statistical characterization of a high-K metal gate 32nm ARM926 core under process variability impact
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Authors
Zuber, Paul
;
Dobrovolny, Petr
;
Laabidi, Selma
;
Javerliac, Virgile
;
Laplanche, Yves
;
Miranda Corbalan, Miguel
Conference
Design Automation Conference - DAC. User Track
Title
Statistical characterization of a high-K metal gate 32nm ARM926 core under process variability impact
Publication type
Oral presentation
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