dc.contributor.author | Zuber, Paul | |
dc.contributor.author | Miranda Corbalan, Miguel | |
dc.contributor.author | Garcia Bardon, Marie | |
dc.contributor.author | Cosemans, Stefan | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Dobrovolny, Petr | |
dc.contributor.author | Chiarella, Thomas | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Mercha, Abdelkarim | |
dc.contributor.author | Hoffmann, Thomas Y. | |
dc.contributor.author | Verkest, Diederik | |
dc.contributor.author | Biesemans, Serge | |
dc.date.accessioned | 2021-10-19T22:36:37Z | |
dc.date.available | 2021-10-19T22:36:37Z | |
dc.date.issued | 2011 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20240 | |
dc.source | IIOimport | |
dc.title | Variability and technology aware SRAM product yield maximization | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Zuber, Paul | |
dc.contributor.imecauthor | Garcia Bardon, Marie | |
dc.contributor.imecauthor | Cosemans, Stefan | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Dobrovolny, Petr | |
dc.contributor.imecauthor | Chiarella, Thomas | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Mercha, Abdelkarim | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.imecauthor | Biesemans, Serge | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Dobrovolny, Petr::0000-0002-1465-481X | |
dc.contributor.orcidimec | Chiarella, Thomas::0000-0002-6155-9030 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 222 | |
dc.source.endpage | 223 | |
dc.source.conference | Symposium on VLSI Technology | |
dc.source.conferencedate | 13/06/2010 | |
dc.source.conferencelocation | Kyoto Japan | |
imec.availability | Published - open access | |