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Variability and technology aware SRAM product yield maximization

dc.contributor.authorZuber, Paul
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorCosemans, Stefan
dc.contributor.authorRoussel, Philippe
dc.contributor.authorDobrovolny, Petr
dc.contributor.authorChiarella, Thomas
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorHoffmann, Thomas Y.
dc.contributor.authorVerkest, Diederik
dc.contributor.authorBiesemans, Serge
dc.date.accessioned2021-10-19T22:36:37Z
dc.date.available2021-10-19T22:36:37Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20240
dc.sourceIIOimport
dc.titleVariability and technology aware SRAM product yield maximization
dc.typeProceedings paper
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorChiarella, Thomas
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.contributor.orcidimecChiarella, Thomas::0000-0002-6155-9030
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage222
dc.source.endpage223
dc.source.conferenceSymposium on VLSI Technology
dc.source.conferencedate13/06/2010
dc.source.conferencelocationKyoto Japan
imec.availabilityPublished - open access


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