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FEOL etch challenges, from planar metal gates towards FinFET devices

dc.contributor.authorAltamirano Sanchez, Efrain
dc.contributor.authorParaschiv, Vasile
dc.contributor.authorBoullart, Werner
dc.date.accessioned2021-10-20T10:01:31Z
dc.date.available2021-10-20T10:01:31Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20282
dc.sourceIIOimport
dc.titleFEOL etch challenges, from planar metal gates towards FinFET devices
dc.typeMeeting abstract
dc.contributor.imecauthorAltamirano Sanchez, Efrain
dc.contributor.imecauthorParaschiv, Vasile
dc.contributor.imecauthorBoullart, Werner
dc.contributor.orcidimecBoullart, Werner::0000-0001-7614-2097
dc.source.peerreviewno
dc.source.conferencePlasma Etch and Strip in Microelectronics - PESM
dc.source.conferencedate15/03/2012
dc.source.conferencelocationGrenoble France
imec.availabilityPublished - imec


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