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Effect of interface states on 1T-FBRAM cell retention

dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorBlomme, Pieter
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAltimime, Laith
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.contributor.authorMendes Almeida, Luciano
dc.contributor.authorCaillat, Christian
dc.contributor.authorMahatme, N.N.
dc.date.accessioned2021-10-20T10:01:54Z
dc.date.available2021-10-20T10:01:54Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20292
dc.sourceIIOimport
dc.titleEffect of interface states on 1T-FBRAM cell retention
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpageMY-1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate15/04/2012
dc.source.conferencelocationAnaheim, CA USA
imec.availabilityPublished - open access


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