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In-tier diagnosis of power domains in 3D TSV ICs

dc.contributor.authorAraga, Yuuki
dc.contributor.authorNagata, Makoto
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorKim, Jaemin
dc.contributor.authorMinas, Nikolaos
dc.contributor.authorMarchal, Pol
dc.contributor.authorTravaly, Youssef
dc.contributor.authorLibois, Michael
dc.contributor.authorLa Manna, Antonio
dc.contributor.authorZhang, Wenqi
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-20T10:02:05Z
dc.date.available2021-10-20T10:02:05Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20296
dc.sourceIIOimport
dc.titleIn-tier diagnosis of power domains in 3D TSV ICs
dc.typeProceedings paper
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorLibois, Michael
dc.contributor.imecauthorLa Manna, Antonio
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage7-Feb
dc.source.conferenceIEEE International 3D Systems Integration Conference - 3DIC
dc.source.conferencedate31/01/2012
dc.source.conferencelocationOsaka Japan
imec.availabilityPublished - open access


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