dc.contributor.author | Araga, Yuuki | |
dc.contributor.author | Nagata, Makoto | |
dc.contributor.author | Van der Plas, Geert | |
dc.contributor.author | Kim, Jaemin | |
dc.contributor.author | Minas, Nikolaos | |
dc.contributor.author | Marchal, Pol | |
dc.contributor.author | Travaly, Youssef | |
dc.contributor.author | Libois, Michael | |
dc.contributor.author | La Manna, Antonio | |
dc.contributor.author | Zhang, Wenqi | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2021-10-20T10:02:05Z | |
dc.date.available | 2021-10-20T10:02:05Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20296 | |
dc.source | IIOimport | |
dc.title | In-tier diagnosis of power domains in 3D TSV ICs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Van der Plas, Geert | |
dc.contributor.imecauthor | Libois, Michael | |
dc.contributor.imecauthor | La Manna, Antonio | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 7-Feb | |
dc.source.conference | IEEE International 3D Systems Integration Conference - 3DIC | |
dc.source.conferencedate | 31/01/2012 | |
dc.source.conferencelocation | Osaka Japan | |
imec.availability | Published - open access | |