dc.contributor.author | Mohammed, A. | |
dc.contributor.author | Trager-Cowan, C. | |
dc.contributor.author | Middleton, P. G. | |
dc.contributor.author | O'Donnell, K. P. | |
dc.contributor.author | Van der Stricht, Wim | |
dc.contributor.author | Moerman, Ingrid | |
dc.contributor.author | Demeester, Piet | |
dc.date.accessioned | 2021-09-30T09:18:50Z | |
dc.date.available | 2021-09-30T09:18:50Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2031 | |
dc.source | IIOimport | |
dc.title | Hexagonal growth hillocks of MOCVD-grown GaN on (0001) sapphire | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Moerman, Ingrid | |
dc.contributor.imecauthor | Demeester, Piet | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 235 | |
dc.source.endpage | 8 | |
dc.source.conference | Microscopy of Semiconducting Materials 1997 | |
dc.source.conferencedate | 7/04/1997 | |
dc.source.conferencelocation | Oxford UK | |
imec.availability | Published - open access | |
imec.internalnotes | IOP Conference Series; Vol. 157 | |