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Tutorial: Scaling challenges of analog electronics at 32nm and beyond

dc.contributor.authorBadaroglu, Mustafa
dc.date.accessioned2021-10-20T10:03:24Z
dc.date.available2021-10-20T10:03:24Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20322
dc.sourceIIOimport
dc.titleTutorial: Scaling challenges of analog electronics at 32nm and beyond
dc.typeOral presentation
dc.contributor.imecauthorBadaroglu, Mustafa
dc.source.peerreviewno
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate10/12/2012
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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