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Circuit and product level assessment of emerging fully depleted channel devices: FinFET and UTBOX-SOI

dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorDehan, Morin
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorZuber, Paul
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorMallik, Arindam
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVerkest, Diederik
dc.date.accessioned2021-10-20T10:03:34Z
dc.date.available2021-10-20T10:03:34Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20325
dc.sourceIIOimport
dc.titleCircuit and product level assessment of emerging fully depleted channel devices: FinFET and UTBOX-SOI
dc.typeProceedings paper
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorZuber, Paul
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorMallik, Arindam
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.orcidimecMallik, Arindam::0000-0002-0742-9366
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.source.peerreviewno
dc.source.conferenceCMOS Emerging Technologies Conference
dc.source.conferencedate18/07/2012
dc.source.conferencelocationVancouver Canada
imec.availabilityPublished - imec


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