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Simulation of rReliability of nanoscale devices

dc.contributor.authorBina, Markus
dc.contributor.authorTriebl, O.
dc.contributor.authorKarner, M.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.date.accessioned2021-10-20T10:06:22Z
dc.date.available2021-10-20T10:06:22Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20365
dc.sourceIIOimport
dc.titleSimulation of rReliability of nanoscale devices
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.conferenceInternational Conference on Simulation of Semiconductor Processes and Devices - SISPAD
dc.source.conferencedate5/09/2012
dc.source.conferencelocationDenver, CO USA
imec.availabilityPublished - imec


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