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Scalability study of fully planarized hybrid floating gate Flash memory cells with high-k IPD

dc.contributor.authorBlomme, Pieter
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-20T10:06:49Z
dc.date.available2021-10-20T10:06:49Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20370
dc.sourceIIOimport
dc.titleScalability study of fully planarized hybrid floating gate Flash memory cells with high-k IPD
dc.typeProceedings paper
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage237
dc.source.endpage240
dc.source.conference4th IEEE International Memory Workshop
dc.source.conferencedate20/05/2012
dc.source.conferencelocationMilano Italy
imec.availabilityPublished - open access


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