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Radiation influence on biaxial+uinaxial strained silicon MuGFETs

dc.contributor.authorBordallo, C.
dc.contributor.authorAgopian, Paula
dc.contributor.authorMartino, Joao
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-20T10:07:51Z
dc.date.available2021-10-20T10:07:51Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20381
dc.sourceIIOimport
dc.titleRadiation influence on biaxial+uinaxial strained silicon MuGFETs
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage2638
dc.source.conferenceECS Fall Meeting Symposium E6: High Purity Silicon 12
dc.source.conferencedate7/10/2012
dc.source.conferencelocationHonolulu, HI USA
imec.availabilityPublished - imec
imec.internalnotesECS Meeting Abstracts; vol. MA2012-02


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