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Cu alloys for conductive bridging memories as studied by C-AFM

dc.contributor.authorCelano, Umberto
dc.contributor.authorGoux, Ludovic
dc.contributor.authorOpsomer, Karl
dc.contributor.authorConard, Thierry
dc.contributor.authorFranquet, Alexis
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-20T10:13:09Z
dc.date.available2021-10-20T10:13:09Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20429
dc.sourceIIOimport
dc.titleCu alloys for conductive bridging memories as studied by C-AFM
dc.typeOral presentation
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.source.peerreviewno
dc.source.conferenceE-MRS Fall Meeting Symp. J: High-Resolution Electrical and Chemical Characterization of Nanometer-Scale Organic and Inorg. Dev.
dc.source.conferencedate17/09/2012
dc.source.conferencelocationWarsaw Poland
imec.availabilityPublished - imec


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