Authors

Chen, Yangyin; Degraeve, Robin; Clima, Sergiu; Govoreanu, Bogdan; Goux, Ludovic; Fantini, Andrea; Kar, Gouri Sankar; Pourtois, Geoffrey; Groeseneken, Guido; Wouters, Dirk; Jurczak, Gosia

Conference

International Electron Devices Meeting - IEDM

Title

Understanding of the endurance failure in scaled HfO2-based 1T1R RRAM through vacancy mobility degradation

Publication type

Proceedings paper

Embargo date

9999-12-31