Show simple item record

Electrical properties of APTMS SAM layers studied with conductive atomic force microscope

dc.contributor.authorChintala, Ravi Chandra
dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorArmini, Silvia
dc.contributor.authorSun, Yiting
dc.date.accessioned2021-10-20T10:16:55Z
dc.date.available2021-10-20T10:16:55Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20456
dc.sourceIIOimport
dc.titleElectrical properties of APTMS SAM layers studied with conductive atomic force microscope
dc.typeOral presentation
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorArmini, Silvia
dc.contributor.imecauthorSun, Yiting
dc.contributor.orcidimecArmini, Silvia::0000-0003-0578-3422
dc.source.peerreviewno
dc.source.conferenceInternational Conference on Scanning Probe Microscopy on Soft and Polymeric Materials
dc.source.conferencedate23/09/2012
dc.source.conferencelocationKerkrade Nederlands
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record