dc.contributor.author | Ciofi, Ivan | |
dc.contributor.author | Mannarino, Manuel | |
dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Beyer, Gerald | |
dc.date.accessioned | 2021-10-20T10:18:18Z | |
dc.date.available | 2021-10-20T10:18:18Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20465 | |
dc.source | IIOimport | |
dc.title | Self-controlled constant-current temperature stress for triangular voltage sweep measurements of Cu | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ciofi, Ivan | |
dc.contributor.imecauthor | Mannarino, Manuel | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.orcidimec | Ciofi, Ivan::0000-0003-1374-4116 | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 113 | |
dc.source.endpage | 123 | |
dc.source.conference | Processing Materials of 3D Interconnections, Damascene and Electronics Packaging | |
dc.source.conferencedate | 9/10/2011 | |
dc.source.conferencelocation | Boston, MA USA | |
imec.availability | Published - imec | |
imec.internalnotes | ECS Transactions; Vol. 41, Issue 43 | |