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Low frequency noise performance of state-of-the-art and emerging CMOS devices

dc.contributor.authorClaeys, Cor
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorAndrade, M.G.C.
dc.contributor.authorRodrigues, Michele
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-20T10:19:49Z
dc.date.available2021-10-20T10:19:49Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20475
dc.sourceIIOimport
dc.titleLow frequency noise performance of state-of-the-art and emerging CMOS devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage567
dc.source.endpage580
dc.source.conferenceDielectrics for Nanosystems 5: Materials Science, Processing, Reliability, and Manufacturing -and- Tutorials in Nanotechnology
dc.source.conferencedate6/05/2012
dc.source.conferencelocationSeattle, WA USA
imec.availabilityPublished - imec
imec.internalnotesECS Transactions; Vol. 45, Iss. 3


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