Radiation hardness aspects of advanced FinFET and UTBOX devices

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Authors
Claeys, Cor; Aoulaiche, Marc; Simoen, Eddy; Griffoni, Alessio; Kobayashi, D.; Mahatme, N.N.; Reed, R.A.; Schrimpf, R.D.; Agopian, P.G.D.; Martino, J.A.
Conference
IEEE International SOI Conference
Title
Radiation hardness aspects of advanced FinFET and UTBOX devices
Publication type
Proceedings paper
Embargo date
9999-12-31
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