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Wideband measurement system for on-chip ESD waveform characterisation

dc.contributor.authorColman, G.
dc.contributor.authorBauwelinck, Johan
dc.contributor.authorGillon, R.
dc.contributor.authorWieers, A.
dc.contributor.authorVandewege, Jan
dc.date.accessioned2021-10-20T10:22:31Z
dc.date.available2021-10-20T10:22:31Z
dc.date.issued2012-02
dc.identifier.issn0013-5194
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20492
dc.sourceIIOimport
dc.titleWideband measurement system for on-chip ESD waveform characterisation
dc.typeJournal article
dc.contributor.imecauthorBauwelinck, Johan
dc.contributor.orcidimecBauwelinck, Johan::0000-0001-5254-2408
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage150
dc.source.endpage152
dc.source.journalElectronics Letters
dc.source.issue3
dc.source.volume48
imec.availabilityPublished - open access


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