Wideband measurement system for on-chip ESD waveform characterisation

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Authors

Colman, G.; Bauwelinck, Johan; Gillon, R.; Wieers, A.; Vandewege, Jan

ISSN

0013-5194

Issue

3

Journal

Electronics Letters

Volume

48

Title

Wideband measurement system for on-chip ESD waveform characterisation

Publication type

Journal article

Embargo date

9999-12-31

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