Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Wideband measurement system for on-chip ESD waveform characterisation
Publication:
Wideband measurement system for on-chip ESD waveform characterisation
Date
2012-02
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
25235.pdf
152.6 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Colman, G.
;
Bauwelinck, Johan
;
Gillon, R.
;
Wieers, A.
;
Vandewege, Jan
Journal
Electronics Letters
Abstract
Description
Metrics
Views
1883
since deposited on 2021-10-20
Acq. date: 2025-10-26
Citations
Metrics
Views
1883
since deposited on 2021-10-20
Acq. date: 2025-10-26
Citations