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Reliability challenges, thermal management problems and CPI

dc.contributor.authorCroes, Kristof
dc.date.accessioned2021-10-20T10:25:15Z
dc.date.available2021-10-20T10:25:15Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20509
dc.sourceIIOimport
dc.titleReliability challenges, thermal management problems and CPI
dc.typeOral presentation
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.source.peerreviewno
dc.source.conference19th International Symposium on the Physical & Failure Analysis of Integrated Circuits - IPFA
dc.source.conferencedate2/07/2012
dc.source.conferencelocationSingapore
imec.availabilityPublished - imec


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