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Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements

dc.contributor.authorCrupi, Felice
dc.contributor.authorAlioto, Massimo
dc.contributor.authorFranco, Jacopo
dc.contributor.authorMagnone, Paolo
dc.contributor.authorTogo, Mitsuhiro
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T10:26:24Z
dc.date.available2021-10-20T10:26:24Z
dc.date.issued2012
dc.identifier.issn1549-7747
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20515
dc.sourceIIOimport
dc.titleUnderstanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements
dc.typeJournal article
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.source.peerreviewyes
dc.source.beginpage439
dc.source.endpage442
dc.source.journalIEEE Transactions on Circuits and Systems II: Express Briefs
dc.source.issue7
dc.source.volume59
imec.availabilityPublished - imec


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