Authors

Crupi, Felice; Alioto, Massimo; Franco, Jacopo; Magnone, Paolo; Togo, Mitsuhiro; Horiguchi, Naoto; Groeseneken, Guido

ISSN

1549-7747

Issue

7

Journal

IEEE Transactions on Circuits and Systems II: Express Briefs

Volume

59

Title

Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements

Publication type

Journal article