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Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements
Publication:
Understanding the basic advantages of bulk FinFETs for sub- and near-threshold logic from device measurements
Date
2012
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Crupi, Felice
;
Alioto, Massimo
;
Franco, Jacopo
;
Magnone, Paolo
;
Togo, Mitsuhiro
;
Horiguchi, Naoto
;
Groeseneken, Guido
Journal
IEEE Transactions on Circuits and Systems II: Express Briefs
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1903
since deposited on 2021-10-20
Acq. date: 2025-10-24
Citations
Metrics
Views
1903
since deposited on 2021-10-20
Acq. date: 2025-10-24
Citations