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Early assessment of emerging technologies for VLSI logic circuits from experimental measurements

dc.contributor.authorCrupi, Felice
dc.contributor.authorMagnone, Paolo
dc.contributor.authorAlioto, Massimo
dc.contributor.authorFranco, Jacopo
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T10:26:34Z
dc.date.available2021-10-20T10:26:34Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20516
dc.sourceIIOimport
dc.titleEarly assessment of emerging technologies for VLSI logic circuits from experimental measurements
dc.typeProceedings paper
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.source.peerreviewyes
dc.source.conferenceIEEE International Conference on Solid-State and Integrated Circuit Technology - ICSICT
dc.source.conferencedate29/10/2012
dc.source.conferencelocationXi'an China
imec.availabilityPublished - imec
imec.internalnotes


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