dc.contributor.author | Nicolett, A. S. | |
dc.contributor.author | Martino, Joao Antonio | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-09-30T09:20:38Z | |
dc.date.available | 2021-09-30T09:20:38Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2053 | |
dc.source | IIOimport | |
dc.title | Simple method to extract the length dependent mobility degradation factor at 77 K | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 159 | |
dc.source.endpage | 170 | |
dc.source.conference | Proceedings of the 4th Symposium on Low Temperature Electronics and High Temperature Superconductivity | |
dc.source.conferencedate | 4/05/1997 | |
dc.source.conferencelocation | Montr�al Canada | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Proceedings; Vol. 97-2 | |