dc.contributor.author | Nigam, Tanya | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-09-30T09:20:43Z | |
dc.date.available | 2021-09-30T09:20:43Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2054 | |
dc.source | IIOimport | |
dc.title | Is the constant current charge-to-breakdown method still a good tool to measure oxide reliability | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | 28th IEEE Semiconductor Interface Specialists Conference - SISC | |
dc.source.conferencedate | 4/12/1997 | |
dc.source.conferencelocation | Charleston, SC USA | |
imec.availability | Published - open access | |