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The impact and importance of line width roughness on sub-20nm nanostructures
Publication:
The impact and importance of line width roughness on sub-20nm nanostructures
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Schepper, Peter
;
Altamirano Sanchez, Efrain
;
Vaglio Pret, Alessandro
;
Boullart, Werner
;
De Gendt, Stefan
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Abstract
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1796
since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations
Metrics
Views
1796
since deposited on 2021-10-20
Acq. date: 2025-12-16
Citations