dc.contributor.author | Nigam, Tanya | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-09-30T09:20:49Z | |
dc.date.available | 2021-09-30T09:20:49Z | |
dc.date.issued | 1997 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2055 | |
dc.source | IIOimport | |
dc.title | Study of dielectric breakdown on 4.3 nm oxides using substrate hot electron injection | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.source.peerreview | no | |
dc.source.conference | SISC-Conference; December 1997; Charleston, South-Carolina, USA. | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |