Gate voltage dependence of reliability for ultra-thin oxides

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Authors
Nigam, Tanya; Depas, Michel; Degraeve, Robin; Heyns, Marc; Groeseneken, Guido
Conference
Proceedings of the Solid State Devices and Materials Conference - SSDM
Title
Gate voltage dependence of reliability for ultra-thin oxides
Publication type
Proceedings paper
Embargo date
9999-12-31
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