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Single-electron capacitance spectroscopy of individual dopants in silicon

dc.contributor.authorDeNinno, Matthew
dc.contributor.authorGasseller, Morewell
dc.contributor.authorHarrison, James
dc.contributor.authorTessmer, Stuart
dc.contributor.authorRogge, Sven
dc.contributor.authorCaymax, Matty
dc.contributor.authorLoo, Roger
dc.date.accessioned2021-10-20T10:39:54Z
dc.date.available2021-10-20T10:39:54Z
dc.date.issued2012-02
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20588
dc.sourceIIOimport
dc.titleSingle-electron capacitance spectroscopy of individual dopants in silicon
dc.typeMeeting abstract
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.beginpageH28.00005
dc.source.conferenceMarch Meeting of The American Physical Society
dc.source.conferencedate27/02/2012
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - imec


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