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Radiation damage in Si1-xGex heteroepitaxial devices

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTakami, Y.
dc.contributor.authorSunaga, H.
dc.date.accessioned2021-09-30T09:22:13Z
dc.date.available2021-09-30T09:22:13Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2068
dc.sourceIIOimport
dc.titleRadiation damage in Si1-xGex heteroepitaxial devices
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.conferenceAPSORC '97
dc.source.conferencedate6/10/1997
dc.source.conferencelocationKumamoto Japan
imec.availabilityPublished - imec


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