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Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorTakami, Y.
dc.contributor.authorKawamura, K.
dc.contributor.authorHakata, T.
dc.contributor.authorSunaga, H.
dc.contributor.authorOgita, Y.
dc.date.accessioned2021-09-30T09:22:22Z
dc.date.available2021-09-30T09:22:22Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2069
dc.sourceIIOimport
dc.titleDegradation and recovery of alpha ray irradiated MOSFETs on SIMOX
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage289
dc.source.endpage295
dc.source.conferenceProceedings of the 8th International Symposium on Silicon-on-Insulator Technology and Devices
dc.source.conferencedate31/08/1997
dc.source.conferencelocationParis France
imec.availabilityPublished - open access
imec.internalnotesECS Proceedings; Vol. 97-23


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