Publication:
Nanoscale strain characterization using transmission electron microscopy: The software package SIMCON
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1992 since deposited on 2021-09-29
3last month
Acq. date: 2026-04-26
Citations
Statistics
Views
1992 since deposited on 2021-09-29
3last month
Acq. date: 2026-04-26
Citations