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On the frequency dependence of the bias temperature instability

dc.contributor.authorGrasser, Tibor
dc.contributor.authorKaczer, Ben
dc.contributor.authorReisinger, Hans
dc.contributor.authorWagner, Paul-Jurgen
dc.contributor.authorToledano Luque, Maria
dc.date.accessioned2021-10-20T11:19:31Z
dc.date.available2021-10-20T11:19:31Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20750
dc.sourceIIOimport
dc.titleOn the frequency dependence of the bias temperature instability
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpageXT.8.1
dc.source.endpageXT.8.7
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate15/04/2012
dc.source.conferencelocationAnaheim, CA USA
dc.identifier.urlhttp://dx.doi.org/10.1109/IRPS.2012.6241938
imec.availabilityPublished - imec


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