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Conference contributions
Recent trends in the electrical characterization and reliability assessment of CMOS devices
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Recent trends in the electrical characterization and reliability assessment of CMOS devices
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Date
2012
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25033.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Degraeve, Robin
;
Cho, Moon Ju
;
Franco, Jacopo
;
Kaczer, Ben
;
Martens, Koen
;
Roussel, Philippe
;
Toledano Luque, Maria
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1874
since deposited on 2021-10-20
Acq. date: 2025-12-18
Citations
Metrics
Views
1874
since deposited on 2021-10-20
Acq. date: 2025-12-18
Citations