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dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-20T11:59:22Z
dc.date.available2021-10-20T11:59:22Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20885
dc.sourceIIOimport
dc.titleAdvanced experimental techniques for BTI characterization (tutorial)
dc.typeOral presentation
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate15/04/2012
dc.source.conferencelocationAnaheim, CA USA
imec.availabilityPublished - imec
imec.internalnotesTutorial


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