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Advanced CMOS devices and reliability (tutorial)

dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-20T11:59:38Z
dc.date.available2021-10-20T11:59:38Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20886
dc.sourceIIOimport
dc.titleAdvanced CMOS devices and reliability (tutorial)
dc.typeOral presentation
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.conferenceIEEE International Conference on Emerging Electronics - ICEE
dc.source.conferencedate15/12/2012
dc.source.conferencelocationMumbai India
dc.identifier.urlhttp://www.ee.iitb.ac.in/~icee/pdf/ICEE_2012_TCP.pdf
imec.availabilityPublished - imec


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