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The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes

dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBukhori, M. F.
dc.contributor.authorAsenov, Asen
dc.contributor.authorSchwarz, Benedikt
dc.contributor.authorBina, Markus
dc.contributor.authorGrasser, Tibor
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T12:00:18Z
dc.date.available2021-10-20T12:00:18Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20888
dc.sourceIIOimport
dc.titleThe relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewyes
dc.source.beginpage5A.2.1
dc.source.endpage5A.2.6
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate15/04/2012
dc.source.conferencelocationAnaheim, CA USA
dc.identifier.urlhttp://dx.doi.org/10.1109/IRPS.2012.6241839
imec.availabilityPublished - imec


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