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Assessing reliability of nano-scaled CMOS technologies one defect at a time

dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorFranco, Jacopo
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-20T12:00:37Z
dc.date.available2021-10-20T12:00:37Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20889
dc.sourceIIOimport
dc.titleAssessing reliability of nano-scaled CMOS technologies one defect at a time
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewno
dc.source.conferenceIEEE International Conference on Emerging Electronics - ICEE
dc.source.conferencedate15/12/2012
dc.source.conferencelocationMumbai India
dc.identifier.urlhttp://www.ee.iitb.ac.in/~icee/pdf/ICEE_2012_TCP.pdf
imec.availabilityPublished - imec


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