dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Toledano Luque, Maria | |
dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Weckx, Pieter | |
dc.contributor.author | Grasser, Tibor | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-20T12:01:19Z | |
dc.date.available | 2021-10-20T12:01:19Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20891 | |
dc.source | IIOimport | |
dc.title | Reliability aware design: from single defect physics to circuit simulations | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Weckx, Pieter | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.source.peerreview | no | |
dc.source.conference | 3rd Fraunhofer CNT Research Day | |
dc.source.conferencedate | 8/11/2012 | |
dc.source.conferencelocation | Dresden Germany | |
dc.identifier.url | http://www.cnt.fraunhofer.de/en/Events_Press/events_trade_fairs/cnt_research_day.html | |
imec.availability | Published - imec | |