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BTI impact on logical gates in nano-scale CMOS technology

dc.contributor.authorKukner, Halil
dc.contributor.authorKhan, Seyab
dc.contributor.authorHamdioui, Said
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-20T12:23:23Z
dc.date.available2021-10-20T12:23:23Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20957
dc.sourceIIOimport
dc.titleBTI impact on logical gates in nano-scale CMOS technology
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.conferenceIEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - DDECS
dc.source.conferencedate18/04/2012
dc.source.conferencelocationTallinn Estonia
imec.availabilityPublished - imec


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