Workload-dependent BTI reliability evaluation of CMOS logic gates

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Authors
Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido
Conference
ICT.OPEN 2012- Interface for Dutch ICT-Research
Title
Workload-dependent BTI reliability evaluation of CMOS logic gates
Publication type
Oral presentation
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