Atomic insight of Ge(1-x)Sn(x) using atom probe tomography

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Authors
Kumar, Arul; Gencarelli, Federica; Vincent, Benjamin; Kambham, Ajay Kumar; Gilbert, Matthieu; Vandervorst, Wilfried
Conference
53rd International Field Emission Symposium - IFES
Title
Atomic insight of Ge(1-x)Sn(x) using atom probe tomography
Publication type
Proceedings paper
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