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Reduced complexity on-chip IQ-imbalance self-calibration

dc.contributor.authorLi, Chunshu
dc.contributor.authorLi, Min
dc.contributor.authorPollin, Sofie
dc.contributor.authorDebaillie, Bjorn
dc.contributor.authorVerhelst, Marian
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.date.accessioned2021-10-20T12:40:59Z
dc.date.available2021-10-20T12:40:59Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21011
dc.sourceIIOimport
dc.titleReduced complexity on-chip IQ-imbalance self-calibration
dc.typeProceedings paper
dc.contributor.imecauthorPollin, Sofie
dc.contributor.imecauthorDebaillie, Bjorn
dc.contributor.imecauthorVerhelst, Marian
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.orcidimecDebaillie, Bjorn::0000-0002-8117-7304
dc.contributor.orcidimecVerhelst, Marian::0000-0003-3495-9263
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.source.peerreviewyes
dc.source.conferenceIEEE Workshop on Signal Processing Systems - SiPS
dc.source.conferencedate16/10/2012
dc.source.conferencelocationQuebec City Canada
dc.identifier.urlhttp://www.sips2012.org/
imec.availabilityPublished - imec


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