Copper electromigration failure times evaluated over a wide range of voiding phases

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Authors
Li, Yunlong; Croes, Kristof; Kirimura, Tomoyuki; Siew, Yong Kong; Tokei, Zsolt
Conference
IEEE International Reliability Physics Symposium - IRPS
Title
Copper electromigration failure times evaluated over a wide range of voiding phases
Publication type
Proceedings paper
Embargo date
9999-12-31
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